The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Nov. 21, 2007
Michael F. Mcgoldrick, North Reading, MA (US);
William T. Borroz, West Newton, MA (US);
Stephen K. Eng, Andover, MA (US);
David A. Milley, Merrimac, MA (US);
Michael F. McGoldrick, North Reading, MA (US);
William T. Borroz, West Newton, MA (US);
Stephen K. Eng, Andover, MA (US);
David A. Milley, Merrimac, MA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
A digital test instrument and a test method provide adjustable results latency. A digital test instrument includes a pattern controller configured to generate a sequence of test patterns, responsive, at least in part, to a pass/fail result, a pattern memory configured to supply the generated sequence of test patterns to a unit under test, a pattern results collection unit configured to receive at least one result value from the unit under test and to determine a pass/fail result for at least one supplied test pattern, and a synchronization unit configured to provide a no-result indication to the pattern controller during a preset number of pattern cycles following the start of a test, the preset number of pattern cycles based on a results latency of the test instrument, and to provide pass/fail results to the pattern controller after the preset number of pattern cycles.