The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2010

Filed:

Jun. 23, 2008
Applicant:

Sun Jae Hwang, Dobong-gu, KR;

Inventor:

Sun Jae Hwang, Dobong-gu, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); H01L 31/062 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image sensor is disclosed that can provide a microlens aligned directly above an active area of a substrate. The image sensor can include a substrate having a pixel area. An active region can be formed on the pixel area and can include photodiodes. Metal lines and an interlayer dielectric can be provided on the pixel area of the substrate. A microlens can be formed above the metal lines and interlayer dielectric to be directly aligned with the active area of the pixel area. To achieve such an alignment, an alignment key of the microlens can be aligned with an alignment key of the active region. In one embodiment, the microlens can avoid being formed right above the metal lines.


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