The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Apr. 28, 2008
Applicants:
Chang-po MA, Hsinchu, TW;
Yuan-chin Liu, Hsinchu, TW;
Inventors:
Chang-Po Ma, Hsinchu, TW;
Yuan-Chin Liu, Hsinchu, TW;
Assignee:
Mediatek Inc., Science-Based Industrial Park, Hsin-Chu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A delay circuit includes a first delay module, a delay measurement unit and a fault judge unit. The first delay module has a first delay circuit with at least one delay stage. The delay measurement unit is used for measuring a first delay amount and a second delay amount of the first delay chain respectively corresponding to a first number and a second number of delay stages. The fault judge unit is used for determining if the first delay chain has delay faults or not according to the first and second delay amounts.