The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7781703 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 24, 2010

Filed:

Jun. 01, 2007
Applicant:

Jun Nagasawa, Chiba, JP;

Inventor:

Jun Nagasawa, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 13/08 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The thermal analyzer comprises temperature deviation approximation formula holder which holds an approximate formula of a temperature deviation between sample and furnace and an elevating or lowering rate of the temperature of furnace during measuring the temperature deviation, programmed temperature corrector which corrects a programmed temperature in proportion to the elevating or lowering rate of the temperature. So that, since the temperature deviation is corrected in proportion to the elevating or lowering rate of the temperature program, the temperature deviation between sample and furnace is controlled to diminish when heating or cooling the sample using the temperature program which elevates or lowers the temperature of the sample or the furnace.


Find Patent Forward Citations

Nagasawa, Jun. (2010). Thermal analyzer (U.S. Patent No. 7781703). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7781703

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