The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Mar. 23, 2006
Applicants:

Theodore Allen Paxton, Chandler, AZ (US);

Steven George Hansen, Phoenix, AZ (US);

Cassandra May Owen, Chandler, AZ (US);

Todd J. Davis, Gilbert, AZ (US);

Todd David Hiar, Gilbert, AZ (US);

James J Hunter, Tempe, AZ (US);

Inventors:

Theodore Allen Paxton, Chandler, AZ (US);

Steven George Hansen, Phoenix, AZ (US);

Cassandra May Owen, Chandler, AZ (US);

Todd J. Davis, Gilbert, AZ (US);

Todd David Hiar, Gilbert, AZ (US);

James J Hunter, Tempe, AZ (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lithographic method to enhance image resolution in a lithographic cluster using multiple projections and a lithographic cluster used to project multiple patterns to form images that are combined to form an image having enhanced resolution.


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