The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Mar. 17, 2008
Pascal Jordil, Ecotaux, CH;
BO Pettersson, London, GB;
Siercks Knut, St. Gallen, CH;
Hexagon Metrology AB, Nacka Strand, SE;
Abstract
A method for scanning a surface of a workpiece using a scanning probemounted on a supporton a coordinate measuring machine. The support contains drive meansfor actuating the movement of the scanning proberelatively to the support. The method further involves detecting meansto measure a contact force F applied between the tipof the probe and the surface, control meanscoupled to the drive means, and memory meansfor storing theoretical profilesand coordinatesof the surface. This method is characterized by the fact that the control meansadjust the actuation of the drive meansalong a scanning pathin order to maintain the contact forcewithin the defined range of valuesduring the whole scanning operation along the scanning path