The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Jan. 02, 2007
Applicants:

Aaron Donald Brandt, Grantham, NH (US);

Richard Ray Anderson, Grantham, NH (US);

Christopher Scott Passage, Canaan, NH (US);

Wayne Chin, Lebanon, NH (US);

Inventors:

Aaron Donald Brandt, Grantham, NH (US);

Richard Ray Anderson, Grantham, NH (US);

Christopher Scott Passage, Canaan, NH (US);

Wayne Chin, Lebanon, NH (US);

Assignee:

Hypertherm, Inc., Hanover, NH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described are computer-based methods and apparatuses for automated self test for a thermal processing system. A signal to execute the automated self test is received. The automated self test is executed. The execution includes executing one or more self test instructions for the one or more subsystems of the system. Data can be received from sensors associated with the subsystems. The data can be analyzed to determine the results of the automated self test for the thermal processing system.


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