The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Nov. 04, 2005
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Yasuhide Kuramochi, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Kiyotaka Ichiyama, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Yasuhide Kuramochi, Tokyo, JP;
Takahiro Yamaguchi, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement having a first pulse generator for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge, a second pulse generator for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance corresponding to timing of the detected boundaries of the data sections, a filter for removing carrier frequency components of said data-signal-under-measurement from first and second pulse signals and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.