The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Mar. 26, 2007
Applicants:

Daniel Richard Bockelman, Tigard, OR (US);

Yuan-chuan Steven Chen, Portland, OR (US);

Christopher John Brookreson, Saint Helens, OR (US);

MD Asifur Rahman, Portland, OR (US);

Inventors:

Daniel Richard Bockelman, Tigard, OR (US);

Yuan-Chuan Steven Chen, Portland, OR (US);

Christopher John Brookreson, Saint Helens, OR (US);

Md Asifur Rahman, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic tool for testing an integrated circuit device directs a beam of laser energy to stimulate at least a portion of the device. In one mode, electromagnetic waves from said device may be detected at the same time in response to the stimulation. A processor collects image data and determines as a function of the collected image data whether the device has a defect. Other embodiments are described and claimed.


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