The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Jun. 29, 2007
Applicants:

Peter J. Geiss, Underhill, VT (US);

Joseph R. Greco, South Burlington, VT (US);

Richard S. Kontra, Williston, VT (US);

Emily Lanning, Westminster, SC (US);

Inventors:

Peter J. Geiss, Underhill, VT (US);

Joseph R. Greco, South Burlington, VT (US);

Richard S. Kontra, Williston, VT (US);

Emily Lanning, Westminster, SC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/082 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of modulating grain size in a polysilicon layer and devices fabricated with the method. The method includes forming the layer of polysilicon on a substrate; and performing an ion implantation of a polysilicon grain size modulating species into the polysilicon layer such that an average resultant grain size of the implanted polysilicon layer after performing a pre-determined anneal is higher or lower than an average resultant grain size than would be obtained after performing the same pre-determined anneal on the polysilicon layer without a polysilicon grain size modulating species ion implant.


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