The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Mar. 31, 2005
Applicants:

Syouji Nogami, Tokyo, JP;

Yukichi Horioka, Tokyo, JP;

Shoichi Yamauchi, Tokyo, JP;

Inventors:

Syouji Nogami, Tokyo, JP;

Yukichi Horioka, Tokyo, JP;

Shoichi Yamauchi, Tokyo, JP;

Assignees:

Sumco Corporation, Tokyo, JP;

Denso Corporation, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

A resistivity of an epitaxial layer in a trench is changed in a stepwise manner by reducing a quantity of an impurity diffused into the epitaxial layer in the trench from a semiconductor wafer in a stepwise manner, thereby suppressing an influence of auto-doping from the semiconductor wafer. An epitaxial layeris grown in a trenchof a semiconductor waferhaving a trench structure by gradually reducing a temperature in a temperature in the range of 400 to 1150° C. by a vapor growth method while supplying a silane gas as a raw material gas, thereby filling the epitaxial layerin the trench


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