The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Nov. 30, 2006
Applicants:

James Walter Blatchford, Richardson, TX (US);

Carl Albert Vickery, Iii, Garland, TX (US);

Inventors:

James Walter Blatchford, Richardson, TX (US);

Carl Albert Vickery, III, Garland, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

In accordance with an embodiment of the invention, there is a method of designing a lithography mask. The method can comprise determining a maximum width of a shifter, wherein the maximum width corresponds to a width of a shifter for a first set of features and determining whether the shifter having the maximum width can be placed in a shifter space for a second set of features. The method can also comprise incrementally decreasing the width of the shifter to be placed into the shifter space for the second set of features when the shifter having the maximum width cannot be placed in the shifter space for a feature in the second set of features until an acceptable shifter width can be determined or until the shifter width is reduced to a predetermined minimum shifter width.


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