The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Dec. 16, 2003
Applicant:

Murthi Nanja, Portland, OR (US);

Inventor:

Murthi Nanja, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

Voltage and frequency scaling techniques that are based upon monitored data are provided. The techniques may be used to better manage the power and energy consumption of a processor in an embedded system, such as a cellular telephone, personal data assistant, smart device, or the like. The techniques may be used with processors that offer a performance monitoring capability. The performance monitor may monitor thread-level utilization at runtime. Instructions per cycle and memory references per cycle are example metrics that may be monitored by the performance monitor. The voltage and frequency scaling techniques may adjust the operating voltage and operating frequency of the processor based on the values of these two metrics. For example, the techniques may include accessing a voltage and frequency scheduler lookup table. The techniques may be employed with non-embedded systems, as well, embedded systems.


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