The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 2010

Filed:

Oct. 26, 2005
Applicants:

Sakuichiro Adachi, Hachioji, JP;

Kunio Harada, Hachioji, JP;

Hideo Enoki, Kasumigaura, JP;

Hironobu Yamakawa, Toride, JP;

Tomonori Mimura, Tomobe, JP;

Inventors:

Sakuichiro Adachi, Hachioji, JP;

Kunio Harada, Hachioji, JP;

Hideo Enoki, Kasumigaura, JP;

Hironobu Yamakawa, Toride, JP;

Tomonori Mimura, Tomobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 1/10 (2006.01); B01L 3/00 (2006.01); B01L 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Conventional liquid transport substrates having a fluid channel formed along an array of electrodes have a problem in which throughput decreases, depending on driving conditions. In order to avoid two-way passage in a fluid channel from the inlet to a measuring section and a fluid channel from the measuring section to the outlet, the measuring section is located in the middle of the fluid channel connecting the inlet and the outlet, so that manipulation from the inlet to the outlet takes place in one direction on the substrate. Even when analyzing a large number of sample droplets, by transport of the droplets substantially in one direction, it is possible to complete measurement in a short time.


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