The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 20, 2010
Filed:
Dec. 23, 2002
Mohammed Kamran Shah, Austin, TX (US);
Jeffrey N. Correll, Cedar Park, TX (US);
Mohammed Kamran Shah, Austin, TX (US);
Jeffrey N. Correll, Cedar Park, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
One embodiment of the present invention comprises a method for displaying a diagram of a measurement system, in which various components in the diagram may be expanded or collapsed as desired. It may be desirable to allow the user to view various aspects of a measurement system at various levels of granularity. For example, the user may desire to view details regarding one or more components in the measurement system but may not want to see details for other components. Providing the ability to expand or collapse components in a measurement system diagram may allow the user to view a compact diagram illustrating the measurement system from a high level, or to expand various components in the diagram to 'drill down' into particular sub-systems or components to view details regarding those sub-systems or components.