The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 20, 2010

Filed:

Feb. 24, 2006
Applicants:

Ludmil Nikolov, Chippenham, GB;

Michael G. France, Portland, OR (US);

Inventors:

Ludmil Nikolov, Chippenham, GB;

Michael G. France, Portland, OR (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a method is provided for measuring a dynamic phase offset between a PLL's input clock and the PLL's feedback input clock, wherein the input clock is spread spectrum modulated in a spread spectrum mode and is not modulated in a static mode. The method includes: in the spread spectrum mode, measuring phase jitter between the input clock and the feedback input clock to form a spread spectrum phase jitter measurement; in the static mode, measuring phase jitter between the input clock and the feedback input clock to form a static phase jitter measurement; and comparing the spread spectrum phase jitter measurement to the static phase jitter measurement to determine the dynamic phase offset.


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