The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Mar. 30, 2007
Applicant:

Haruyoshi Ono, Nakakoma-gun, JP;

Inventor:

Haruyoshi Ono, Nakakoma-gun, JP;

Assignee:

Eudyna Devices Inc., Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A testing system includes a plurality of test applying portions and a plurality of testing portions, each test applying portion having a test device that generates an output signal and each testing portion tests the output signal of the test device, in response to the test applying portion. The testing system further includes a switch portion that switches the output signal of the test device between the test applying portions and the testing portions. The test applying portion has a selecting portion that selects the testing portion through the switch portion for testing the output signal according to test item information, the test item information including information about a test capability of the testing portion.


Find Patent Forward Citations

Loading…