The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 13, 2010
Filed:
Aug. 10, 2007
Hiroshi Nakamura, Hitachinaka, JP;
Tsukasa Shishika, Mito, JP;
Yasushi Terui, Tsuchiura, JP;
Takuya Saeki, Hitachinaka, JP;
Hiroshi Nakamura, Hitachinaka, JP;
Tsukasa Shishika, Mito, JP;
Yasushi Terui, Tsuchiura, JP;
Takuya Saeki, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An ion trap time-of-flight mass spectrometer capable of obtaining highly-sensitive mass spectra even on the lower mass number side is realized. The ion trap time-of-flight mass spectrometer includes an ion source that operates at atmospheric pressure, an ion optical system for introducing the ions generated by the ion source into a vacuum chamber and converging the ions introduced into the vacuum chamber, an ion trap part for trapping ions in the vacuum chamber, a multipole part for converging the kinetic energy of the ions discharged from the ion trap, and a time-of-flight mass spectrometry part for measuring the ions discharged from the multipole part. The period of high-voltage pulses generated by an electrode provided in the time-of-flight mass spectrometry part can be changed depending on an ion content introduced into the multipole part.