The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Jan. 11, 2005
Applicants:

Chelladurai Devadoss, Hillsboro, OR (US);

Mandar Bhave, Austin, TX (US);

Runhui Huang, Rolla, MO (US);

Inventors:

Chelladurai Devadoss, Hillsboro, OR (US);

Mandar Bhave, Austin, TX (US);

Runhui Huang, Rolla, MO (US);

Assignee:

Brewer Science Inc., Rolla, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08F 8/00 (2006.01); C08F 16/02 (2006.01); C08F 16/12 (2006.01); C08F 20/06 (2006.01); C08F 118/02 (2006.01); C08F 2/00 (2006.01); C08F 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

New anti-reflective or fill compositions having improved flow properties are provided. The compositions comprise a dendritic polymer dispersed or dissolved in a solvent system, and preferably a light attenuating compound, a crosslinking agent, and a catalyst. The inventive compositions can be used to protect contact or via holes from degradation during subsequent etching in the dual damascene process. The inventive compositions can also be applied to substrates (e.g., silicon wafers) to form anti-reflective coating layers having high etch rates which minimize or prevent reflection during subsequent photoresist exposure and developing.


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