The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 13, 2010

Filed:

Jul. 20, 2005
Applicants:

Akira Dangami, Tokyo, JP;

Kenji Kobayashi, Tokyo, JP;

Yoshiaki Sugishita, Tokyo, JP;

Inventors:

Akira Dangami, Tokyo, JP;

Kenji Kobayashi, Tokyo, JP;

Yoshiaki Sugishita, Tokyo, JP;

Assignee:

Lintec Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 41/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The label making apparatus of the invention comprises a guide platefor guiding a raw sheet M in a predetermined feeding direction, an inspecting devicefor inspecting a label L on a release liner S constituting the raw sheet M, a transfer devicefor partially bypassing the feeding direction of the release liner to peel off a label from the release liner and temporarily sticking the non-defective label at a position on the release liner advanced toward the downstream side in the feeding direction by a predetermined distance, and a collecting devicefor collecting a defective when a defective label is detected. The transfer deviceadjusts the bypass length of the release liner so that a certain interval is kept between the non-defective label after a defective label is detected with respect to the preceding non-defective label.


Find Patent Forward Citations

Dangami, Akira. (2010). Label making apparatus (U.S. Patent No. 7753097). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7753097

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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