The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Oct. 25, 2007
Leendert M. Huisman, South Burlington, VT (US);
William V. Huott, Holmes, NY (US);
Maroun Kassab, St-Eustache, CA;
Franco Motika, Hopewell Junction, NY (US);
Leendert M. Huisman, South Burlington, VT (US);
William V. Huott, Holmes, NY (US);
Maroun Kassab, St-Eustache, CA;
Franco Motika, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems, methods and apparatus are provided for isolating a defect in a scan chain. The invention includes modifying a first test mode of a plurality of latches included in a scan chain, operating the latches in the modified first test mode, and operating the plurality of latches included in the scan chain in a second test mode. A portion of the scan chain adjacent and following a stuck-@-0 or stuck-@-1 fault in the scan chain may store and/or output a value complementary to the value on the output of the previous portion of the scan chain due to the fault. Such values may be unloaded from the scan chain and used for diagnosing (e.g., isolating a defect in) the defective scan chain. Numerous other aspects are provided.