The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2010
Filed:
Jan. 27, 2006
Ken Harada, Wako, JP;
Tetsuya Akashi, Fujimi, JP;
Yoshihiko Togawa, Wako, JP;
Tsuyoshi Matsuda, Wako, JP;
Noboru Moriya, Wako, JP;
Ken Harada, Wako, JP;
Tetsuya Akashi, Fujimi, JP;
Yoshihiko Togawa, Wako, JP;
Tsuyoshi Matsuda, Wako, JP;
Noboru Moriya, Wako, JP;
Riken, Saitama, JP;
Abstract
An interferometer is disclosed which has upper-stage, intermediate-stage, and lower-stage electron biprisms. The disclosed interferometer operates with an azimuth angle Φ among filament electrodes of the three electron biprisms to arbitrarily control an interference area and an azimuth θ of the interference fringes formed therein, eliminates Fresnel fringes generation, and allows independent control of an interference fringe spacing s and the azimuth θ of the interference fringes.