The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7749866 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 06, 2010

Filed:

Jan. 22, 2008
Applicants:

Fu Tang Chu, Fengshan, TW;

Chi Yuam Chung, Kaohsiung, TW;

Inventors:

Fu Tang Chu, Fengshan, TW;

Chi Yuam Chung, Kaohsiung, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/301 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for sawing a wafer includes the following steps. A wafer which has an active surface, a back surface and a plurality of longitudinal and transverse sawing lines is provided, wherein the sawing lines are located on the active surface so as to define a plurality of dies. A multiple-type tape is attached on the active surface of the wafer, wherein the multiple-type tape includes a first tape and a second tape, the second tape is located between the first tape and the active surface of the wafer, and the second tape is transparent. The back surface of the wafer is grinded. The first tape is removed. Finally, the wafer including the second tape is sawn along the sawing lines so as to separate the dies from one another.


Find Patent Forward Citations

Chu, Fu. (2010). Method for sawing a wafer and method for manufacturing a semiconductor package by using a multiple-type tape (U.S. Patent No. 7749866). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7749866

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