The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 29, 2010

Filed:

Oct. 03, 2006
Applicants:

Nicholas L. Abbott, Madison, WI (US);

Brian H. Clare, Philadelphia, PA (US);

Inventors:

Nicholas L. Abbott, Madison, WI (US);

Brian H. Clare, Philadelphia, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides devices and methods for detection of analytes based on measuring the anchoring strength of liquid crystals having distorted geometries. Methods for detecting an analyte in a sample include the steps of: (a) capturing an analyte on a substrate surface wherein the substrate surface defines an easy axis when in contact with a liquid crystal. Substrate surface and liquid crystal are brought into contact and an analyte-dependent departure in the orientation of the liquid crystal from the easy axis of the substrate surface is measured. This departure indicates the presence of the analyte in the sample.


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