The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Jul. 23, 2008
Rohit Kapur, Cupertino, CA (US);
Nodari Sitchinava, San Mateo, CA (US);
Samitha Samaranayake, San Mateo, CA (US);
Emil Gizdarski, Santa Clara, CA (US);
Frederic J. Neuveux, Meylan, FR;
Suryanarayana Duggirala, San Jose, CA (US);
Thomas W. Williams, Boulder, CO (US);
Rohit Kapur, Cupertino, CA (US);
Nodari Sitchinava, San Mateo, CA (US);
Samitha Samaranayake, San Mateo, CA (US);
Emil Gizdarski, Santa Clara, CA (US);
Frederic J. Neuveux, Meylan, FR;
Suryanarayana Duggirala, San Jose, CA (US);
Thomas W. Williams, Boulder, CO (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.