The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 22, 2010
Filed:
Sep. 21, 2007
Peter Schwarz, Koenigsdorf, DE;
Uwe Sperling, Geretsried, DE;
Peter Schwarz, Koenigsdorf, DE;
Uwe Sperling, Geretsried, DE;
BYK-Gardner GmbH, , DE;
Abstract
An apparatus () for analysing surface properties, comprising a first radiation device () which emits radiation directly onto a surface () to be analyzed, a first illumination device () for indirectly illuminating the surface () to be analyzed, a first radiation detector device () which receives at least part of the radiation thrown back from the surface () to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device () is provided which is at least partially illuminated by the first illumination device () and which transmits scattered radiation onto the surface () to be analyzed.