The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Feb. 27, 2008
Applicants:

Miho Ozawa, Abiko, JP;

Ryoji Inaba, Hitachinaka, JP;

Inventors:

Miho Ozawa, Abiko, JP;

Ryoji Inaba, Hitachinaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/453 (2006.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
Abstract

To reduce the elongation of the migration time for the first electrophoresis cycle in successive electrophoresis cycles and improve the reliability of electrophoresis analysis. The present invention relates to making the condition of a migration medium at the start of the first electrophoresis analysis in successive electrophoresis analyses after the temperature in a thermostatic oven reaches a desired preset temperature substantially the same as the conditions after the successive electrophoresis analyses. Preferably, a voltage is applied to a separation medium filling a capillary during preheating of the thermostatic oven. Preferably, the temperature in the thermostatic oven during preheating is set higher than the temperature in the thermostatic oven during electrophoresis analysis. Preferably, a buffer solution is heated during preheating of the thermostatic oven. Preferably, the capillary is filled with a preheated separation medium during preheating of the thermostatic oven. According to the present invention, the reliability of the first electrophoresis analysis in successive electrophoresis analyses is improved.


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