The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Aug. 28, 2007
Srinivasan Dasasathyan, Santa Clara, CA (US);
Hasan Arslan, Santa Clara, CA (US);
Meng Lou, Markham, CA;
Anirban Rahut, Sunnyvale, CA (US);
Srinivasan Dasasathyan, Santa Clara, CA (US);
Hasan Arslan, Santa Clara, CA (US);
Meng Lou, Markham, CA;
Anirban Rahut, Sunnyvale, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
Methods of estimating delays between pins on a tile-based programmable logic device (PLD), by identifying repeat patterns and exploiting these patterns to provide accurate delay estimates. A computer-implemented method can include selecting a sample area in a tile-based PLD and constructing a delay table corresponding to the sample area. Each entry in the delay table includes a base delay value and a description of the fastest available route from a source pin in a source tile to a load pin in the sample area. To estimate a net delay, the base delay value and the description of the route are read from the delay table for specified source and load pins. One or more delay variants (e.g., pin delays and/or crossing penalties) are calculated based on the description of the route. The calculated delay variants are added to the base delay value to obtain an adjusted delay value, which is output.