The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Mar. 16, 2004
Noboru Kikuchi, Nisshin, JP;
Minako Sekiguchi, Ann Arbor, MI (US);
Hiroo Yamaoka, Toyota, JP;
Hiroyuki Umetani, Nagoya, JP;
Noboru Kikuchi, Nisshin, JP;
Minako Sekiguchi, Ann Arbor, MI (US);
Hiroo Yamaoka, Toyota, JP;
Hiroyuki Umetani, Nagoya, JP;
Kabushiki Kaisha Toyota Chuo Kenkyusho, Aichi-gun, JP;
Abstract
A process is disclosed for estimating by a computer a relationship between geometric distortion of an element used for approximately representing the shape of an object to be analyzed by a finite element method, and an analysis error which occurs, due to the geometric distortion of the element, in analysis results of the object by the finite element method. The process includes: assuming at least one deformation mode occurring in the element upon deformation of the object, in the form of at least one of tension, bending, shear, and torsion; and estimating the analysis error associated with the geometric distortion, for each of the at least one assumed deformation mode.