The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Apr. 23, 2008
Mehrab S. Sedeh, Beaverton, OR (US);
Robert D. Twete, Beaverton, OR (US);
Mehrab S. Sedeh, Beaverton, OR (US);
Robert D. Twete, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
The apparatus for a test and measurement instrument consists of multiple integrated circuits with each integrated circuit being connected to its own memory controller. At least one of the integrated circuits is a specialized integrated circuit, which may be a graphics processing unit, a digital signal processor, or a field-programmable gate array. Each memory controller is connected to its own memory. The integrated circuits are connected in a circular arrangement by multiple high-speed interconnects. A bridge is connected to at least the first and last integrated circuits. A system bus connects the bridge to an acquisition module. The acquisition module has a signal bus interface with the system bus being connected to the acquisition module and having its own acquisition hardware. The acquisition hardware is a direct memory access machine that can transfer data to any portion of the memory. There is a signal source connected to the signal bus interface.