The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Oct. 21, 2008
Chak Tong Albert Sze, Hong Kong, CN;
Pei Wei Tsai, Hong Kong, CN;
Sai Kit Wong, Hong Kong, CN;
Wai Hong Sizto, Hong Kong, CN;
Chak Tong Albert Sze, Hong Kong, CN;
Pei Wei Tsai, Hong Kong, CN;
Sai Kit Wong, Hong Kong, CN;
Wai Hong Sizto, Hong Kong, CN;
ASM Assembly Automation Ltd., Hong Kong, HK;
Abstract
A test handler is provided for testing electronic devices having light-emitting elements. Electronic devices are mounted at a loading position, optical measurements are conducted at a test contact position where a testing device is located for optical communication with the light-emitting elements and then tested electronic devices are removed at an unloading position. Multiple test contactors hold the electronic devices and move them to and through the loading position, test contact position and unloading position in sequence. Each test contactor comprises a device contact point including electrical conductors which are connected to electrical contacts of the electronic device when the electronic device is mounted at the device contact point, and a retaining mechanism grips the electronic device at the device contact point such that the retaining mechanism does not obstruct the optical communication between the testing device and the light-emitting element at the test contact position.