The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7732296 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 08, 2010

Filed:

Jan. 25, 2006
Applicants:

Jung-min Park, Jeollanam-do, KR;

Seok-jun Won, Seoul, KR;

Min-woo Song, Seongnam-si, KR;

Yong-kuk Jeong, Seoul, KR;

Dae-jin Kwon, Suwon-si, KR;

Weon-hong Kim, Suwon-si, KR;

Inventors:

Jung-min Park, Jeollanam-do, KR;

Seok-jun Won, Seoul, KR;

Min-woo Song, Seongnam-si, KR;

Yong-kuk Jeong, Seoul, KR;

Dae-jin Kwon, Suwon-si, KR;

Weon-hong Kim, Suwon-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method of fabricating a metal-insulator-metal (MIM) capacitor and a metal-insulator-metal (MIM) capacitor fabricated according to the method, the method comprises: forming an insulating-layer pattern on a semiconductor substrate, the insulating-layer pattern having a plurality of openings that respectively define areas where capacitor cells are to be formed; forming a lower electrode conductive layer on the insulating-layer pattern and on the semiconductor substrate; forming a first sacrificial layer that fills the openings on the lower electrode conductive layer; forming a second sacrificial layer on of the first sacrificial layer; planarizing the second sacrificial layer; exposing an upper surface of the lower electrode conductive layer; removing the exposed lower electrode conductive layer to form a plurality of lower electrodes that are separated from each other, each corresponding to a capacitor cell; and forming dielectric layers and upper electrodes, that are separated from each other, each corresponding to a capacitor cell, on each of the lower electrodes to provide a plurality of MIM capacitor cells constituting one capacitor to which the same electric signal is applied.


Find Patent Forward Citations

Park, Jung-min. (2010). Method of fabricating metal-insulator-metal capacitor and metal-insulator-metal capacitor manufactured by the method (U.S. Patent No. 7732296). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7732296

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