The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Sep. 28, 2007
Applicants:

Vinodh Gopal, Westboro, MA (US);

John Vranich, West Roxbury, MA (US);

Pierre Laurent, Quin County Clare, IE;

Daniel Cutter, Maynard, MA (US);

Wajdi K. Feghali, Boston, MA (US);

Andrew Milne, Ottawa, CA;

Erdinc Ozturk, Worcester, MA (US);

Inventors:

Vinodh Gopal, Westboro, MA (US);

John Vranich, West Roxbury, MA (US);

Pierre Laurent, Quin County Clare, IE;

Daniel Cutter, Maynard, MA (US);

Wajdi K. Feghali, Boston, MA (US);

Andrew Milne, Ottawa, CA;

Erdinc Ozturk, Worcester, MA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for testing mathematical programs where code coverage is exceedingly difficult to hit with random data test vectors (probability <2) is provided. To enable testing of the mathematical program, instructions in the mathematical program are trapped. Errors are injected through the use of any status/control flag where an error can be created and be rectified later by a reversible operation so that the result of the mathematical operation is not modified by the injected error.


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