The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Mar. 24, 2008
Peter Waegli, Bremgarten, CH;
Felix Mullis, Flums, CH;
Peter Waegli, Bremgarten, CH;
Felix Mullis, Flums, CH;
Inficon GmbH, Bad Ragaz, CH;
Abstract
For evaluation of a measured parameter with a measuring cell having a cavity which generates for light an optical path length difference changing corresponding to the variation of the measured parameter, the method includes: introducing light from a white light source with the aid of an optical waveguide via a coupler () disposed in the path of the optical waveguide into the cavity, coupling out at least a portion of the light reflected back into the optical waveguide from the cavity with the aid of the coupler and conducting this reflected light to an optical spectrometer, determining the optical spectrum of the reflected light in the spectrometer and generating a spectrometer signal, conducting the spectrometer signal to a computing unit, wherein the spectrometer signal is directly converted through the computing unit to an interferogram and from its intensity progression the location of the particular extremal amplitude value is determined and this particular location represents directly the particular value of the optical path length difference in the cavity, which comprises the measured parameter.