The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Jun. 11, 2007
Robert L. Maziasz, Austin, TX (US);
Vladimir P. Rozenfeld, Andreevka, RU;
Iouri Smirnov, Andreevka, RU;
Sergei V. Somov, Moscow, RU;
Igor G. Topouzov, Moscow, RU;
Lyudmila Zinchenko, Moscow, RU;
Robert L. Maziasz, Austin, TX (US);
Vladimir P. Rozenfeld, Andreevka, RU;
Iouri Smirnov, Andreevka, RU;
Sergei V. Somov, Moscow, RU;
Igor G. Topouzov, Moscow, RU;
Lyudmila Zinchenko, Moscow, RU;
Freescale Semiconductor, Inc., Austin, TX (US);
Abstract
A method, data processing system, and computer program product are provided for routing a circuit placement a number of times, resulting in a number of routings. An electromigration quality value is computed for each of the routings, and the routing with the best electromigration quality value is selected. In one embodiment, each routing is analyzed with attention to the current that passes through each of the routing's segments in order to compute a current distribution that is used to compute a routing quality vector. In another embodiment, multiple placements are generated and the electromigration placement quality vectors are computed for the various placements with the placement with the best electromigration quality vector being selected. In one embodiment, the placement with the best electromigration quality vector is routed the number of times to determine the routing with the lowest (best) electromigration quality value.