The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7721181 B1

PDF
Full Text
Expired
Date of Patent:
May. 18, 2010

Filed:

Jul. 11, 2007
Applicants:

Chun-yu Liao, Taichung, TW;

Shih-chang Huang, Penghu County, TW;

Inventors:

Chun-Yu Liao, Taichung, TW;

Shih-Chang Huang, Penghu County, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A memory 1-bit error checking method is provided. Firstly, at least one piece of data fragment whose side is 2bits is received. Next, an error correction code, a parity code and a data code are generated and written in the memory. Then, the at least one piece of data fragment is read from the memory and used as at least one piece of read data fragment. Next, a new error correction code, a new parity code and a new data code are generated. Afterwards, a determination as to whether the at least one piece of read data fragment has a 1-bit error is made. After that, if the at least one piece of read data fragment does not have a 1-bit error, then the at least one piece of read data fragment is outputted.


Find Patent Forward Citations

Liao, Chun-Yu. (2010). Memory and 1-bit error checking method thereof (U.S. Patent No. 7721181). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7721181

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