The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Mar. 28, 2007
Applicant:

David A. Hult, Danbury, CT (US);

Inventor:

David A. Hult, Danbury, CT (US);

Assignee:

ASML Holding N.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/54 (2006.01); G03B 27/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A uniformity correction system may be used as an actuator for the correction of asymmetry scan-integrated illumination pupil fill that varies in the non-scanning direction of a lithography system. Instead of minimizing asymmetric opaque element insertion, opaque elements are inserted into an illumination beam to introduce an additional pupil asymmetry into the illumination beam. The compensating pupil asymmetry substantially nulls the original pupil asymmetry. To introduce the pupil asymmetry, a first opaque element can be moved into or out of the illumination beam in tandem with a second, opposing opaque element. Iterative feedback of both uniformity and pupil asymmetry ensure that both are substantially simultaneously optimized.


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