The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Feb. 20, 2007
Uei-ming Jow, Chutung Hsinchu, TW;
Min-lin Lee, Chutung Hsinchu, TW;
Shinn-juh Lay, Chutung Hsinchu, TW;
Chin-sun Shyu, Chutung Hsinchu, TW;
Chang-sheng Chen, Chutung Hsinchu, TW;
Uei-Ming Jow, Chutung Hsinchu, TW;
Min-Lin Lee, Chutung Hsinchu, TW;
Shinn-Juh Lay, Chutung Hsinchu, TW;
Chin-Sun Shyu, Chutung Hsinchu, TW;
Chang-Sheng Chen, Chutung Hsinchu, TW;
Industrial Technology Research Institute, Hsinchu, TW;
Abstract
A method is provided for testing a built-in component including multiple terminals in a multi-layered circuit board. At least one signal pad is provided on a top surface of the multi-layered circuit board for signal transmission. Each of the signal pads are electrically connected to one of the multiple terminals. At least one test pad is provided on the top surface of the multi-layered circuit board and each of the test pads is electrically connected to one of the multiple terminals. Then, detection occurs regarding one of the signal pads and one of the test pads that are electrically connected to a same one of the multiple terminals in order to determine a connection status of an electric path extending from the one signal pad through the same one terminal to the one test pad.