The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2010
Filed:
Aug. 30, 2007
Benno Heigl, Coburg, DE;
Stefan Hoppe, Amberg, DE;
Joachim Hornegger, Effeltrich, DE;
Ernst-peter Rührnschopf, Erlangen, DE;
Holger Scherl, Bad Hersfeld, DE;
Bernhard Scholz, Heroldsbach, DE;
Michael Zellerhoff, Forchheim, DE;
Benno Heigl, Coburg, DE;
Stefan Hoppe, Amberg, DE;
Joachim Hornegger, Effeltrich, DE;
Ernst-Peter Rührnschopf, Erlangen, DE;
Holger Scherl, Bad Hersfeld, DE;
Bernhard Scholz, Heroldsbach, DE;
Michael Zellerhoff, Forchheim, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
To enable an artifact free reconstruction even in the case of large regions of interest and with scanning paths of below 360°, provision is made for a method, with which a three-dimensional image volume is reconstructed from a number of two-dimensional projection images of a region of interest, which were recorded about the region of interest during a rotation of a recording system, comprising an x-ray source with a focal point and a detector, by calculating the gray scale values of the voxels of the image volume by back projection of the projection images, with which each two-dimensional projection images is composed in each instance from at least two individual projection images to form an extended two-dimensional projection image, with the respectively at least two individual projection images being recorded with a constant relative position between the focal point and the region of interest.