The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Aug. 02, 2006
Paul A. Laberge, Shoreview, MN (US);
Jeffrey J. Rooney, Blaine, MN (US);
Charles K. Snodgrass, Bosie, ID (US);
Paul A. LaBerge, Shoreview, MN (US);
Jeffrey J. Rooney, Blaine, MN (US);
Charles K. Snodgrass, Bosie, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Embodiments herein may enable an algorithmic pattern generator (APG) to present iterative values of one or more operational parameters to a device under test (DUT). At each iteration, one or more test patterns may be presented to the DUT. The APG may capture test results from a set of iterations of the operational parameters. The APG may also write values associated with a next operational parameter to be iterated to a test parameter configuration space within the device tester.