The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
May. 17, 2004
Jayabrata Ghosh Dastidar, San Jose, CA (US);
Jayabrata Ghosh Dastidar, San Jose, CA (US);
Altera Corporation, San Jose, CA (US);
Abstract
Built-in self test techniques for testing circuit blocks on integrated circuits are provided. A BIST controller is provided on-chip to test two or more circuit blocks. High routing congestion is avoided by loading test data into the circuit blocks through scan chain segments that run continuously along the inputs and outputs of the circuit blocks. The BIST controller takes control of the scan chain segments during test and has the ability to partition the scan chains at specified intervals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile