The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Feb. 24, 2006
Applicant:
Junji Oaki, Kanagawa, JP;
Inventor:
Junji Oaki, Kanagawa, JP;
Assignee:
Advanced Mask Inspection Technology Inc., Yokohama-shi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a reticle inspecting apparatus or the like, there is provided an image correcting method which is effective when a rank of a matrix lacks due to continuous equal grayscale values when an image is handled as a matrix. In the image correcting method, a random noise image having fine grayscale is superposed on a pattern image to make a matrix full-rank.
Oaki, Junji. (2010). Image correcting method (U.S. Patent No. 7706623). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7706623
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile