The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 27, 2010

Filed:

Jan. 09, 2008
Applicants:

Taku Amada, Kanagawa, JP;

Seizo Suzuki, Kanagawa, JP;

Satoru Itoh, Kanagawa, JP;

Tomohiro Nakajima, Tokyo, JP;

Inventors:

Taku Amada, Kanagawa, JP;

Seizo Suzuki, Kanagawa, JP;

Satoru Itoh, Kanagawa, JP;

Tomohiro Nakajima, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical scanning apparatus scans a surface to be scanned in a main scanning direction by simultaneously using a plurality of optical spots formed of a plurality of optical beams emitted from an illuminant, comprising: a light path deflecting part deflecting a light path of at least one of the optical beams, wherein the light path deflecting part is provided in light paths of the optical beams wherein the light path deflecting part may use a liquid crystal deflecting element formed of a liquid crystal element being controllable by an electronic signal to deflect the light path of the one of the optical beams.


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