The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 27, 2010
Filed:
Sep. 10, 2007
Applicants:
Hyock-jun Lee, Incheon, KR;
Choel-hwyi Bae, Suwon-si, KR;
Yeong-lyeol Park, Gyeonggi-do, KR;
Nam-young Lee, Yongin-si, KR;
Mi-joung Lee, Seongnam-si, KR;
Inventors:
Hyock-Jun Lee, Incheon, KR;
Choel-Hwyi Bae, Suwon-si, KR;
Yeong-Lyeol Park, Gyeonggi-do, KR;
Nam-Young Lee, Yongin-si, KR;
Mi-Joung Lee, Seongnam-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test pattern includes a normal pattern, an abnormal pattern having predetermined defects, and a conductive line electrically connected to the normal pattern and electrically isolated from the abnormal pattern. Thus, a non-contact test process and a contact test process may be compatible with the single test pattern.