The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Jul. 11, 2007
Applicants:

Mitsukiyo Matsui, Kanagawa, JP;

Tarou Fukunaga, Kanagawa, JP;

Mie Yamanaka, Kanagawa, JP;

Hiroki Tomoshige, Kanagawa, JP;

Maya Ishino, Kanagawa, JP;

Muneaki Kyoya, Tokyo, JP;

Satoru Nishioka, Kanagawa, JP;

Inventors:

Mitsukiyo Matsui, Kanagawa, JP;

Tarou Fukunaga, Kanagawa, JP;

Mie Yamanaka, Kanagawa, JP;

Hiroki Tomoshige, Kanagawa, JP;

Maya Ishino, Kanagawa, JP;

Muneaki Kyoya, Tokyo, JP;

Satoru Nishioka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

To provide a pattern correction apparatus which enables easy correction of a trace which is not present on trace grids, a pattern correction apparatus which makes a correction to a pattern of an integrated circuit includes a trace movement section for moving, among traces forming the pattern of the integrated circuit, a trace which is not present on trace grids to a position above the trace grids; a pattern correction section for making a correction to the pattern; and a trace pitch optimization section for optimizing a trace pitch between traces forming a pattern corrected by the pattern correction section.


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