The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 30, 2010
Filed:
Jan. 09, 2008
Jason Raymond Baumgartner, Austin, TX (US);
Geert Janssen, Putnam Valley, NY (US);
Hari Mony, Austin, TX (US);
Viresh Paruthi, Austin, TX (US);
Jason Raymond Baumgartner, Austin, TX (US);
Geert Janssen, Putnam Valley, NY (US);
Hari Mony, Austin, TX (US);
Viresh Paruthi, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product for performing parametric reduction of sequential designs is disclosed. The method comprises receiving an initial design including one or more primary inputs, one or more targets, and one or more state elements. A cut of the initial design including one or more cut gates is identified, and a relation of one or more values producible to the one or more cut gates in terms of the one or more primary inputs and the one or more state elements is computed. The relation is synthesized to form a gate set, and an abstracted design is formed from the gate set. Verification is performed on the abstracted design to generate verification results.