The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Dec. 25, 2006
Applicants:

Zhiqiang Chen, Beijing, CN;

Yuanjing LI, Beijing, CN;

Yinong Liu, Beijing, CN;

Junli LI, Beijing, CN;

Hua Peng, Beijing, CN;

Yaohong Liu, Beijing, CN;

Shangmin Sun, Beijing, CN;

Jinyu Zhang, Beijing, CN;

Qingjun Zhang, Beijing, CN;

LI Zhang, Beijing, CN;

Yali Xie, Beijing, CN;

Yanli Deng, Beijing, CN;

Ming Ruan, Beijing, CN;

Siyuan Liang, Beijing, CN;

Guang Yang, Beijing, CN;

Wei Jia, Beijing, CN;

Inventors:

Zhiqiang Chen, Beijing, CN;

Yuanjing Li, Beijing, CN;

Yinong Liu, Beijing, CN;

Junli Li, Beijing, CN;

Hua Peng, Beijing, CN;

Yaohong Liu, Beijing, CN;

Shangmin Sun, Beijing, CN;

Jinyu Zhang, Beijing, CN;

Qingjun Zhang, Beijing, CN;

Li Zhang, Beijing, CN;

Yali Xie, Beijing, CN;

Yanli Deng, Beijing, CN;

Ming Ruan, Beijing, CN;

Siyuan Liang, Beijing, CN;

Guang Yang, Beijing, CN;

Wei Jia, Beijing, CN;

Assignees:

Nuctech Company Limited, Beijing, CN;

Tsinghua University, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a system for imaging inspection of a movable object is provided, comprising: a first detecting unit configured to inspect whether a moving object to be inspected moves into a passage or not; a second detecting unit for inspecting whether a part to be shielded of the moving object passes into the passage or not and generating a passing signal after the first detecting unit inspects that the moving object to be inspected moves into the passage; a scan imaging device for emitting radiating beams for scan inspecting the moving object to be inspected; and a control system for generating a control signal for controlling the emitted radiating beams from the scan imaging device according to the passing signal from the second detecting unit. With the above system thereof, the imaging inspection of the moving object with rapid speed can be undertaken safely and reliably.


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