The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
May. 24, 2007
Dan Baker, Medina, OH (US);
Michael D. Rayman, Akron, OH (US);
Gregory Sobolewski, Seven Hills, OH (US);
Dan Baker, Medina, OH (US);
Michael D. Rayman, Akron, OH (US);
Gregory Sobolewski, Seven Hills, OH (US);
Keithley Instruments, Inc., Cleveland, OH (US);
Abstract
An instrument for measuring electrical parameters includes a measurement section having a measurement aperture; and a support section providing at least one of power and digital control for the measurement section. The support section has an interference signal frequency, wherein the interference frequency is an integer multiple of the reciprocal of the measurement aperture and the measurement aperture and the interference signal are phase-locked. As a result, the effect of the interference signal on electrical parameters measured is minimized.