The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 2010
Filed:
Sep. 05, 2008
Carl Scharrer, Keller, TX (US);
Dave Rose, Lakewood, OH (US);
Martin J. Rice, Sagamore Hills, OH (US);
James A. Niemann, Aurora, OH (US);
William F. Merkel, Aurora, OH (US);
Warren Kumley, Solon, OH (US);
William Knauer, Chagrin Falls, OH (US);
Wayne C. Goeke, Hudson, OH (US);
Carl Scharrer, Keller, TX (US);
Dave Rose, Lakewood, OH (US);
Martin J. Rice, Sagamore Hills, OH (US);
James A. Niemann, Aurora, OH (US);
William F. Merkel, Aurora, OH (US);
Warren Kumley, Solon, OH (US);
William Knauer, Chagrin Falls, OH (US);
Wayne C. Goeke, Hudson, OH (US);
Keithley Instruments, Inc., Cleveland, OH (US);
Abstract
A test head for testing a DUT includes a probe card having a plurality of DUT probes, the probes being in contact with the DUT during the testing; an instrument carrier, the instrument carrier being located above the DUT during the testing; and a SMU mounted on the carrier for each of the probes, each SMU being operably connectable to a respective probe, wherein the carrier is moved with respect to the probe card to permit replacement of the probe card.