The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 09, 2010
Filed:
Aug. 26, 2005
Applicants:
Philip F. Taday, Cambridge, GB;
Yao-chun Shen, Cambridge, GB;
Inventors:
Philip F. Taday, Cambridge, GB;
Yao-Chun Shen, Cambridge, GB;
Assignee:
Teraview Limited, Cambridge, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of investigating an object, comprising the steps of: (a) irradiating the object with an optically-generated pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 100 GHz to 100 THz; (b) detecting radiation transmitted and/or reflected from the object to obtain a time domain waveform; (c) repeating steps (a) and (b) for a plurality of points on the object and (d) combining data from step (c) to produce a time domain waveform for the object which has been averaged over the plurality of points.